Structural and optical characterization of In2 S3 films deposited by silar method

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dc.contributor.authorTuran, E.
dc.contributor.authorTaskopru, T.
dc.contributor.authorZor, M.
dc.contributor.authorKul, M.
dc.contributor.authorAybek, A.S.
dc.date.accessioned2015-07-30T08:23:23Z
dc.date.available2015-07-30T08:23:23Z
dc.date.issued2011
dc.identifier.citationSolar Asia 2011 International Conference:p.103-104
dc.identifier.urihttps://dl-ifs.nsf.gov.lk/handle/1/484
dc.publisherInstitute of Fundamental Studies:Kandy
dc.subjectPhysics
dc.subjectSocial development
dc.titleStructural and optical characterization of In2 S3 films deposited by silar method
dc.typeProceedings

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